Time:

3:00p.m., Tuesday, Sep. 29, 2020

Venue:

Tencent Meeting ID: 569 643 209

Password: 312312

Topic:

Studies show that neural networks, not unlike traditional programs, are subject to bugs, e.g., adversarial samples that cause classification errors and discriminatory instances that demonstrate the lack of fairness. Given that neural networks are increasingly applied in critical applications (e.g., self-driving cars, face recognition systems and personal credit rating systems), it is desirable that systematic methods are developed to verify or falsify neural networks against desirable properties. In this lecture, the speaker will introduce the latest research work and existing problems in neural network testing and verification.

Lecturer:

SUN, Jun is currently an associate professor at Singapore Management University (SMU). He received Bachelor and PhD degrees in computing science from National University of Singapore (NUS) in 2002 and 2006. In 2007, he received the prestigious LEE KUAN YEW postdoctoral fellowship. He has been a faculty member since 2010. He was a visiting scholar at MIT from 2011-2012. Jun's research interests include software engineering, formal methods, program analysis and cyber-security. He is the co-founder of the PAT model checker. To this date, he has more than 200 journal articles or peer-reviewed conference papers, many of which are published at top-tier venues. His academic papers have won many international conference awards, and he is also the organizer of many international conferences.

Organizer:

Office of International Cooperation & College of Intelligence and Computing,

Tianjin University